All FV series scopes are bench-top video microscopes designed for inspecting patch cords and ferrules just after polishing. They are available in several magnifications, but in general, our “400x” models are used after polishing to inspect for fine defects incurred during the polishing or cleaning process. The “200x” models are most commonly used to inspect for cleanliness during system assembly prior to mating connectors.
Westover FV systems have become the industry standard because they deliver crystal clear imaging of fine defects. These systems include a valuable feature not found anywhere else in the industry. When depressed, our ScratchView button provides a specialized contrast enhancement algorithm over the surface of the glass fiber. This filter makes fine defects readily detectable and dramatically reduces the need for extensive training of technicians. Using this feature can help cut down on disputes between vendors and customers as both sides will see everything.
It should be noted that we have taken liberty with the magnification values we state with these models. Actual magnification is dependent on monitor size. Actual magnification can be determined using the technical bulletin linked below.
Westover Scientific occupies an enormous market share in bench-top video inspection. We have accomplished this by providing rugged, simple microscopes that deliver a superior level of detail than microscopes 10 times the cost. While this claim may seem exceptional, we invite you to compare our FV series to any on the market today. Like most process engineers in the world, we are sure you’ll find the value unmatched.
The FVDW series are our dual integrated workstations. These units feature a microscope base attached below the monitor. This integration saves space on the table and eliminates cumbersome cables. In the base, we incorporate two patch cord microscopes with an A/B switch to select which image is displayed on the monitor. These units are popular for a number of reasons. Some users prefer dual workstations because it allows them to insert one type of adapter on the left side and a different one on the right side (ie: Universal 1.25 vs. Universal 2.5, MTP vs. SC, etc.). This reduces the time to inspect as you do not have to change adapters frequently.
Other users prefer dual workstations because they can choose a 200x system on the left and a 400x system on the right. This allows for precision inspection of the glass followed by a wide-field inspection of the contact zone for contamination.
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